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Metal implants-dependent carrier recombination characterist..:
Gaubas, E.
;
Uleckas, A.
;
Vanhellemont, J.
.
Materials Science in Semiconductor Processing. 11 (2008) 5-6 - p. 291-294 , 2008
Link:
https://doi.org/10.1016/j.mssp.2008.07.009
RT Journal T1 <Title>Metal implants-dependent carrier recombination characteristics in Ge</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.mssp.2008.07.009&Exemplar=1&LAN=DE A1 Gaubas, E. A1 Uleckas, A. A1 Vanhellemont, J. A1 Geens, W. PB Elsevier BV YR 2008 SN 1369-8001 JF Materials Science in Semiconductor Processing VO 11 IS 5-6 SP 291 OP 294 LK http://dx.doi.org/https://doi.org/10.1016/j.mssp.2008.07.009 DO https://doi.org/10.1016/j.mssp.2008.07.009 SF ELIB - SuUB Bremen
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