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1 Ergebnisse
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Transport and storage properties of CrSi2/Si junctions made..:
Deneb Menda, Uğur
;
Özdemir, Orhan
;
Tatar, Beyhan
..
Materials Science in Semiconductor Processing. 13 (2010) 4 - p. 257-266 , 2010
Link:
https://doi.org/10.1016/j.mssp.2010.12.002
RT Journal T1
Transport and storage properties of CrSi2/Si junctions made using the CAPVD technique
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.mssp.2010.12.002&Exemplar=1&LAN=DE A1 Deneb Menda, Uğur A1 Özdemir, Orhan A1 Tatar, Beyhan A1 Ürgen, Mustafa A1 Kutlu, Kubilay PB Elsevier BV YR 2010 SN 1369-8001 JF Materials Science in Semiconductor Processing VO 13 IS 4 SP 257 OP 266 LK http://dx.doi.org/https://doi.org/10.1016/j.mssp.2010.12.002 DO https://doi.org/10.1016/j.mssp.2010.12.002 SF ELIB - SuUB Bremen
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