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1 Ergebnisse
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Effects of CuO film thickness on electrical properties of C..:
Chabane, L.
;
Zebbar, N.
;
Zeggar, M. Lamri
...
Materials Science in Semiconductor Processing. 40 (2015) - p. 840-847 , 2015
Link:
https://doi.org/10.1016/j.mssp.2015.07.080
RT Journal T1 <Title>Effects of CuO film thickness on electrical properties of CuO/ZnO and CuO/ZnS hetero-junctions</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.mssp.2015.07.080&Exemplar=1&LAN=DE A1 Chabane, L. A1 Zebbar, N. A1 Zeggar, M. Lamri A1 Aida, M.S. A1 Kechouane, M. A1 Trari, M. PB Elsevier BV YR 2015 SN 1369-8001 JF Materials Science in Semiconductor Processing VO 40 SP 840 OP 847 LK http://dx.doi.org/https://doi.org/10.1016/j.mssp.2015.07.080 DO https://doi.org/10.1016/j.mssp.2015.07.080 SF ELIB - SuUB Bremen
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