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X-ray peak broadening and optical properties analysis of Sn..:
Bagherian, Siamak
;
Zak, A. Khorsand
Materials Science in Semiconductor Processing. 56 (2016) - p. 52-58 , 2016
Link:
https://doi.org/10.1016/j.mssp.2016.07.021
RT Journal T1 <Title>X-ray peak broadening and optical properties analysis of SnO2 nanosheets prepared by sol-gel method</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.mssp.2016.07.021&Exemplar=1&LAN=DE A1 Bagherian, Siamak A1 Zak, A. Khorsand PB Elsevier BV YR 2016 SN 1369-8001 JF Materials Science in Semiconductor Processing VO 56 SP 52 OP 58 LK http://dx.doi.org/https://doi.org/10.1016/j.mssp.2016.07.021 DO https://doi.org/10.1016/j.mssp.2016.07.021 SF ELIB - SuUB Bremen
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