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1 Ergebnisse
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Temperature-dependent Fowler-Nordheim electron barrier heig..:
Fiorenza, Patrick
;
Vivona, Marilena
;
Iucolano, Ferdinando
...
Materials Science in Semiconductor Processing. 78 (2018) - p. 38-42 , 2018
Link:
https://doi.org/10.1016/j.mssp.2017.11.024
RT Journal T1
Temperature-dependent Fowler-Nordheim electron barrier height in SiO2/4H-SiC MOS capacitors
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.mssp.2017.11.024&Exemplar=1&LAN=DE A1 Fiorenza, Patrick A1 Vivona, Marilena A1 Iucolano, Ferdinando A1 Severino, Andrea A1 Lorenti, Simona A1 Nicotra, Giuseppe A1 Bongiorno, Corrado A1 Giannazzo, Filippo A1 Roccaforte, Fabrizio PB Elsevier BV YR 2018 SN 1369-8001 JF Materials Science in Semiconductor Processing VO 78 SP 38 OP 42 LK http://dx.doi.org/https://doi.org/10.1016/j.mssp.2017.11.024 DO https://doi.org/10.1016/j.mssp.2017.11.024 SF ELIB - SuUB Bremen
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