I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

Characterization of crystalline GeSn layer on tensile-strai..:

Miao, Yuanhao ; Wang, Yibo ; Hu, Huiyong...
Materials Science in Semiconductor Processing.  85 (2018)  - p. 134-140 , 2018
Link: https://doi.org/10.1016/j.mssp.2018.05.013