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1 Ergebnisse
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Pulsed 70 kV X-ray sensing behavior of Cu2HgI4 thick films:
Praveenkumar, P.
;
Subashini, T.
;
Rakini, S.
..
Materials Science in Semiconductor Processing. 91 (2019) - p. 201-205 , 2019
Link:
https://doi.org/10.1016/j.mssp.2018.11.032
RT Journal T1 <Title>Pulsed 70 kV X-ray sensing behavior of Cu2HgI4 thick films</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.mssp.2018.11.032&Exemplar=1&LAN=DE A1 Praveenkumar, P. A1 Subashini, T. A1 Rakini, S. A1 Stephen, A. A1 Prakash, T. PB Elsevier BV YR 2019 SN 1369-8001 JF Materials Science in Semiconductor Processing VO 91 SP 201 OP 205 LK http://dx.doi.org/https://doi.org/10.1016/j.mssp.2018.11.032 DO https://doi.org/10.1016/j.mssp.2018.11.032 SF ELIB - SuUB Bremen
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