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Quantitative depth profile analysis of InP/InGaAs hetero-in..:
Choi, Minhyuk
;
Jung, In-Young
;
Song, Seungwoo
.
Materials Science in Semiconductor Processing. 120 (2020) - p. 105251 , 2020
Link:
https://doi.org/10.1016/j.mssp.2020.105251
RT Journal T1 <Title>Quantitative depth profile analysis of InP/InGaAs hetero-interfaces by as carry-over</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.mssp.2020.105251&Exemplar=1&LAN=DE A1 Choi, Minhyuk A1 Jung, In-Young A1 Song, Seungwoo A1 Kim, Chang Soo PB Elsevier BV YR 2020 SN 1369-8001 JF Materials Science in Semiconductor Processing VO 120 SP 105251 LK http://dx.doi.org/https://doi.org/10.1016/j.mssp.2020.105251 DO https://doi.org/10.1016/j.mssp.2020.105251 SF ELIB - SuUB Bremen
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