I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Corrigendum to' X-ray diffraction and secondary ion mass sp..:
Meyer, Kevin
;
Buchholz, Martin
;
Uxa, Daniel
...
Materials Science in Semiconductor Processing. 122 (2021) - p. 105544 , 2021
Link:
https://doi.org/10.1016/j.mssp.2020.105544
RT Journal T1 <Title>Corrigendum to' X-ray diffraction and secondary ion mass spectrometry investigations of GaN films grown on (0 0 1) and (1 1 0) MgF2 substrates by plasma-assisted molecular beam epitaxy (PA-MBE)'. Materials science in semiconductor processing 119 (2020) 105,262</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.mssp.2020.105544&Exemplar=1&LAN=DE A1 Meyer, Kevin A1 Buchholz, Martin A1 Uxa, Daniel A1 Dörrer, Lars A1 Schmidt, Harald A1 Schaadt, Daniel M. PB Elsevier BV YR 2021 SN 1369-8001 JF Materials Science in Semiconductor Processing VO 122 SP 105544 LK http://dx.doi.org/https://doi.org/10.1016/j.mssp.2020.105544 DO https://doi.org/10.1016/j.mssp.2020.105544 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
