I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

Admittance spectroscopy of dopants implanted in silicon and..:

Smolyakov, D.A. ; Tarasov, A.S. ; Bondarev, M.A....
Materials Science in Semiconductor Processing.  126 (2021)  - p. 105663 , 2021
Link: https://doi.org/10.1016/j.mssp.2021.105663