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Investigation on method of reducing surface leakage current..:
Feng, Chengjie
;
Min, Jiahua
;
Liang, Xiaoyan
...
Materials Science in Semiconductor Processing. 137 (2022) - p. 106234 , 2022
Link:
https://doi.org/10.1016/j.mssp.2021.106234
RT Journal T1 <Title>Investigation on method of reducing surface leakage current of the CdZnTe photoconductive detector with MSM structure</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.mssp.2021.106234&Exemplar=1&LAN=DE A1 Feng, Chengjie A1 Min, Jiahua A1 Liang, Xiaoyan A1 Zhang, Jijun A1 Wang, Linjun A1 Shen, Yue PB Elsevier BV YR 2022 SN 1369-8001 JF Materials Science in Semiconductor Processing VO 137 SP 106234 LK http://dx.doi.org/https://doi.org/10.1016/j.mssp.2021.106234 DO https://doi.org/10.1016/j.mssp.2021.106234 SF ELIB - SuUB Bremen
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