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Experimental measurement of stress evolution in silicon car..:
Yu, Huijie
;
Liu, Xingyu
;
Li, Dawei
Materials Science in Semiconductor Processing. 138 (2022) - p. 106275 , 2022
Link:
https://doi.org/10.1016/j.mssp.2021.106275
RT Journal T1 <Title>Experimental measurement of stress evolution in silicon carbide composite electrode during electrochemical cycling</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.mssp.2021.106275&Exemplar=1&LAN=DE A1 Yu, Huijie A1 Liu, Xingyu A1 Li, Dawei PB Elsevier BV YR 2022 SN 1369-8001 JF Materials Science in Semiconductor Processing VO 138 SP 106275 LK http://dx.doi.org/https://doi.org/10.1016/j.mssp.2021.106275 DO https://doi.org/10.1016/j.mssp.2021.106275 SF ELIB - SuUB Bremen
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