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1 Ergebnisse
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Effects of rapid thermal annealing on deep-level defects an..:
Gelczuk, Łukasz
;
Kopaczek, Jan
;
Pucicki, Damian
...
Materials Science in Semiconductor Processing. 169 (2024) - p. 107888 , 2024
Link:
https://doi.org/10.1016/j.mssp.2023.107888
RT Journal T1 <Title>Effects of rapid thermal annealing on deep-level defects and optical properties of n-type GaAsBi alloys grown by molecular beam epitaxy at low temperature</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.mssp.2023.107888&Exemplar=1&LAN=DE A1 Gelczuk, Łukasz A1 Kopaczek, Jan A1 Pucicki, Damian A1 Rockett, Thomas B.O. A1 Richards, Robert D. A1 Kudrawiec, Robert PB Elsevier BV YR 2024 SN 1369-8001 JF Materials Science in Semiconductor Processing VO 169 SP 107888 LK http://dx.doi.org/https://doi.org/10.1016/j.mssp.2023.107888 DO https://doi.org/10.1016/j.mssp.2023.107888 SF ELIB - SuUB Bremen
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