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Electron emission from alignment-controlled multiple stacks..:
Makihara, Katsunori
;
Yamamoto, Yuji
;
Yagi, Hiroya
...
Materials Science in Semiconductor Processing. 174 (2024) - p. 108227 , 2024
Link:
https://doi.org/10.1016/j.mssp.2024.108227
RT Journal T1 <Title>Electron emission from alignment-controlled multiple stacks of SiGe nanodots embedded in Si structures</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.mssp.2024.108227&Exemplar=1&LAN=DE A1 Makihara, Katsunori A1 Yamamoto, Yuji A1 Yagi, Hiroya A1 Li, Lingrui A1 Taoka, Noriyuki A1 Tillack, Bernd A1 Miyazaki, Seiichi PB Elsevier BV YR 2024 SN 1369-8001 JF Materials Science in Semiconductor Processing VO 174 SP 108227 LK http://dx.doi.org/https://doi.org/10.1016/j.mssp.2024.108227 DO https://doi.org/10.1016/j.mssp.2024.108227 SF ELIB - SuUB Bremen
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