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1 Ergebnisse
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Revisiting stacking fault identification based on the chara..:
Na, Moonkyong
;
Bahng, Wook
;
Jung, Hyundon
...
Materials Science in Semiconductor Processing. 175 (2024) - p. 108247 , 2024
Link:
https://doi.org/10.1016/j.mssp.2024.108247
RT Journal T1
Revisiting stacking fault identification based on the characteristic photoluminescence emission wavelengths of silicon carbide epitaxial wafers
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.mssp.2024.108247&Exemplar=1&LAN=DE A1 Na, Moonkyong A1 Bahng, Wook A1 Jung, Hyundon A1 Oh, Chanhyoung A1 Jang, Donghyun A1 Hong, Soon-Ku PB Elsevier BV YR 2024 SN 1369-8001 JF Materials Science in Semiconductor Processing VO 175 SP 108247 LK http://dx.doi.org/https://doi.org/10.1016/j.mssp.2024.108247 DO https://doi.org/10.1016/j.mssp.2024.108247 SF ELIB - SuUB Bremen
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