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Advanced characterization of SiC devices by optical beam in..:
Planson, Dominique
;
Tournier, Dominique
;
Sonneville, Camille
...
Materials Science in Semiconductor Processing. 178 (2024) - p. 108444 , 2024
Link:
https://doi.org/10.1016/j.mssp.2024.108444
RT Journal T1
Advanced characterization of SiC devices by optical beam induced current (OBIC): Experimental and simulation results
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.mssp.2024.108444&Exemplar=1&LAN=DE A1 Planson, Dominique A1 Tournier, Dominique A1 Sonneville, Camille A1 Bevilacqua, Pascal A1 Viet Phung, Luong A1 Morel, Hervé PB Elsevier BV YR 2024 SN 1369-8001 JF Materials Science in Semiconductor Processing VO 178 SP 108444 LK http://dx.doi.org/https://doi.org/10.1016/j.mssp.2024.108444 DO https://doi.org/10.1016/j.mssp.2024.108444 SF ELIB - SuUB Bremen
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