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Confirmation of the presence of edge dislocations in the pr..:
Basak, Sanghita
;
Das, Ratan
Materials Science in Semiconductor Processing. 179 (2024) - p. 108477 , 2024
Link:
https://doi.org/10.1016/j.mssp.2024.108477
RT Journal T1 <Title>Confirmation of the presence of edge dislocations in the prepared FCC ZnTe nanocrystals from the study of structural analysis through the MWH method with added Fourier analysis (W-A method) of diffraction peaks</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.mssp.2024.108477&Exemplar=1&LAN=DE A1 Basak, Sanghita A1 Das, Ratan PB Elsevier BV YR 2024 SN 1369-8001 JF Materials Science in Semiconductor Processing VO 179 SP 108477 LK http://dx.doi.org/https://doi.org/10.1016/j.mssp.2024.108477 DO https://doi.org/10.1016/j.mssp.2024.108477 SF ELIB - SuUB Bremen
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