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Retracted: Micromechanical properties characterization of 4..:
Hou, Dongyang
;
Lv, Ting
;
Ouyang, Yuhang
..
Materials Science in Semiconductor Processing. 180 (2024) - p. 108543 , 2024
Link:
https://doi.org/10.1016/j.mssp.2024.108543
RT Journal T1 <Title>Retracted: Micromechanical properties characterization of 4H–SiC single crystal by indentation and scratch methods</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.mssp.2024.108543&Exemplar=1&LAN=DE A1 Hou, Dongyang A1 Lv, Ting A1 Ouyang, Yuhang A1 Dong, Fang A1 Liu, Sheng PB Elsevier BV YR 2024 SN 1369-8001 JF Materials Science in Semiconductor Processing VO 180 SP 108543 LK http://dx.doi.org/https://doi.org/10.1016/j.mssp.2024.108543 DO https://doi.org/10.1016/j.mssp.2024.108543 SF ELIB - SuUB Bremen
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