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1 Ergebnisse
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Analysis of energy density and scanning speed impacts on Ni..:
Zhang, Liang
;
Huang, Tao
;
Lu, Sen
...
Materials Science in Semiconductor Processing. 184 (2024) - p. 108760 , 2024
Link:
https://doi.org/10.1016/j.mssp.2024.108760
RT Journal T1
Analysis of energy density and scanning speed impacts on Ni/SiC ohmic contacts during laser annealing
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.mssp.2024.108760&Exemplar=1&LAN=DE A1 Zhang, Liang A1 Huang, Tao A1 Lu, Sen A1 Yang, Kaiming A1 Chen, Jing A1 Zhou, Jiong PB Elsevier BV YR 2024 SN 1369-8001 JF Materials Science in Semiconductor Processing VO 184 SP 108760 LK http://dx.doi.org/https://doi.org/10.1016/j.mssp.2024.108760 DO https://doi.org/10.1016/j.mssp.2024.108760 SF ELIB - SuUB Bremen
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