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Analyzing probability of detection as a function of defect ..:
Moskovchenko, Alexey
;
Švantner, Michal
;
Vavilov, Vladimir
.
NDT & E International. 130 (2022) - p. 102673 , 2022
Link:
https://doi.org/10.1016/j.ndteint.2022.102673
RT Journal T1
Analyzing probability of detection as a function of defect size and depth in pulsed IR thermography
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.ndteint.2022.102673&Exemplar=1&LAN=DE A1 Moskovchenko, Alexey A1 Švantner, Michal A1 Vavilov, Vladimir A1 Chulkov, Arsenii PB Elsevier BV YR 2022 SN 0963-8695 JF NDT & E International VO 130 SP 102673 LK http://dx.doi.org/https://doi.org/10.1016/j.ndteint.2022.102673 DO https://doi.org/10.1016/j.ndteint.2022.102673 SF ELIB - SuUB Bremen
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