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1 Ergebnisse
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Characterization of small single photon avalanche diode fab..:
Oh, Jinseok
;
Jeong, Hakcheon
;
Lee, Min Sun
.
Nuclear Engineering and Technology. 56 (2024) 8 - p. 3076-3083 , 2024
Link:
https://doi.org/10.1016/j.net.2024.03.006
RT Journal T1
Characterization of small single photon avalanche diode fabricated using standard 180 nm CMOS process for digital SiPM
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.net.2024.03.006&Exemplar=1&LAN=DE A1 Oh, Jinseok A1 Jeong, Hakcheon A1 Lee, Min Sun A1 Kwon, Inyong PB Elsevier BV YR 2024 SN 1738-5733 JF Nuclear Engineering and Technology VO 56 IS 8 SP 3076 OP 3083 LK http://dx.doi.org/https://doi.org/10.1016/j.net.2024.03.006 DO https://doi.org/10.1016/j.net.2024.03.006 SF ELIB - SuUB Bremen
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