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Discriminant analysis and secondary-beam charge recognition:

Łukasik, J. ; Adrich, P. ; Aumann, T....
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment.  587 (2008)  2-3 - p. 413-419 , 2008
Link: https://doi.org/10.1016/j.nima.2008.01.071