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Evolution of surface roughness in silicon X-ray mirrors exp..:

Ziegler, E. ; Peverini, L. ; Vaxelaire, N....
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment.  616 (2010)  2-3 - p. 188-192 , 2010
Link: https://doi.org/10.1016/j.nima.2009.12.062