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Radiation hardness studies on CMOS monolithic pixel sensors:
Battaglia, Marco
;
Bisello, Dario
;
Contarato, Devis
...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 624 (2010) 2 - p. 425-427 , 2010
Link:
https://doi.org/10.1016/j.nima.2010.03.156
RT Journal T1
Radiation hardness studies on CMOS monolithic pixel sensors
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.nima.2010.03.156&Exemplar=1&LAN=DE A1 Battaglia, Marco A1 Bisello, Dario A1 Contarato, Devis A1 Denes, Peter A1 Doering, Dionisio A1 Giubilato, Piero A1 Sung Kim, Tae A1 Mattiazzo, Serena A1 Radmilovic, Velimir A1 Zalusky, Sarah PB Elsevier BV YR 2010 SN 0168-9002 JF Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment VO 624 IS 2 SP 425 OP 427 LK http://dx.doi.org/https://doi.org/10.1016/j.nima.2010.03.156 DO https://doi.org/10.1016/j.nima.2010.03.156 SF ELIB - SuUB Bremen
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