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Time dependence of charge losses at the Si–SiO2 interface i..:

Poehlsen, Thomas ; Fretwurst, Eckhart ; Klanner, Robert..
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment.  731 (2013)  - p. 172-176 , 2013
Link: https://doi.org/10.1016/j.nima.2013.03.035