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Test beam evaluation of newly developed n-in-p planar pixel..:

Kimura, K. ; Yamaguchi, D. ; Motohashi, K....
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 831 (2016) - p. 140-146 , 2016

Link: https://doi.org/10.1016/j.nima.2016.04.004

RT Journal
T1 <Title>Test beam evaluation of newly developed n-in-p planar pixel sensors for use in a high radiation environment</Title>

UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.nima.2016.04.004&Exemplar=1&LAN=DE
				
A1 Kimura, K.
A1 Yamaguchi, D.
A1 Motohashi, K.
A1 Nakamura, K.
A1 Unno, Y.
A1 Jinnouchi, O.
A1 Altenheiner, S.
A1 Blue, A.
A1 Bomben, M.
A1 Butter, A.
A1 Cervelli, A.
A1 Crawley, S.
A1 Ducourthial, A.
A1 Gisen, A.
A1 Hagihara, M.
A1 Hanagaki, K.
A1 Hara, K.
A1 Hirose, M.
A1 Homma, Y.
A1 Ikegami, Y.
A1 Kamada, S.
A1 Kono, T.
A1 Macchiolo, A.
A1 Marchiori, G.
A1 Meloni, F.
A1 Milovanovic, M.
A1 Morton, A.
A1 Mullier, G.
A1 Munoz, F.J.
A1 Nellist, C.
PB Elsevier BV
YR 2016
SN 0168-9002
JF Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
VO 831
SP 140
OP 146
LK http://dx.doi.org/https://doi.org/10.1016/j.nima.2016.04.004
DO https://doi.org/10.1016/j.nima.2016.04.004
SF ELIB - SuUB Bremen

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