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X-ray response evaluation in subpixel level for X-ray SOI p..:
Negishi, Kousuke
;
Kohmura, Takayoshi
;
Hagino, Kouichi
...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 924 (2019) - p. 462-467 , 2019
Link:
https://doi.org/10.1016/j.nima.2018.06.073
RT Journal T1 <Title>X-ray response evaluation in subpixel level for X-ray SOI pixel detectors</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.nima.2018.06.073&Exemplar=1&LAN=DE A1 Negishi, Kousuke A1 Kohmura, Takayoshi A1 Hagino, Kouichi A1 Kogiso, Taku A1 Oono, Kenji A1 Yarita, Keigo A1 Sasaki, Akinori A1 Tamasawa, Koki A1 Go Tsuru, Takeshi A1 Tanaka, Takaaki A1 Matsumura, Hideaki A1 Tachibana, Katsuhiro A1 Hayashi, Hideki A1 Harada, Sodai A1 Mori, Koji A1 Takeda, Ayaki A1 Nishioka, Yusuke A1 Takebayashi, Nobuaki A1 Yokoyama, Shoma A1 Fukuda, Kohei A1 Arai, Yasuo A1 Miyoshi, Toshinobu A1 Kishimoto, Shunji A1 Kurachi, Ikuo PB Elsevier BV YR 2019 SN 0168-9002 JF Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment VO 924 SP 462 OP 467 LK http://dx.doi.org/https://doi.org/10.1016/j.nima.2018.06.073 DO https://doi.org/10.1016/j.nima.2018.06.073 SF ELIB - SuUB Bremen
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