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Proton radiation damage experiment for X-ray SOI pixel dete..:
Yarita, Keigo
;
Kohmura, Takayoshi
;
Hagino, Kouichi
...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 924 (2019) - p. 457-461 , 2019
Link:
https://doi.org/10.1016/j.nima.2018.09.057
RT Journal T1 <Title>Proton radiation damage experiment for X-ray SOI pixel detectors</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.nima.2018.09.057&Exemplar=1&LAN=DE A1 Yarita, Keigo A1 Kohmura, Takayoshi A1 Hagino, Kouichi A1 Kogiso, Taku A1 Oono, Kenji A1 Negishi, Kousuke A1 Tamasawa, Koki A1 Sasaki, Akinori A1 Yoshiki, Satoshi A1 Tsuru, Takeshi Go A1 Tanaka, Takaaki A1 Matsumura, Hideaki A1 Tachibana, Katsuhiro A1 Hayashi, Hideki A1 Harada, Sodai A1 Takeda, Ayaki A1 Mori, Koji A1 Nishioka, Yusuke A1 Takebayashi, Nobuaki A1 Yokoyama, Shoma A1 Fukuda, Kohei A1 Arai, Yasuo A1 Miyoshi, Toshinobu A1 Kurachi, Ikuo A1 Hamano, Tsuyoshi PB Elsevier BV YR 2019 SN 0168-9002 JF Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment VO 924 SP 457 OP 461 LK http://dx.doi.org/https://doi.org/10.1016/j.nima.2018.09.057 DO https://doi.org/10.1016/j.nima.2018.09.057 SF ELIB - SuUB Bremen
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