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Characterisation, simulation and test beam data analysis of..:
Zatocilova, Iveta
;
Arling, Jan-Hendrik
;
Baselga, Marta
...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 1061 (2024) - p. 169132 , 2024
Link:
https://doi.org/10.1016/j.nima.2024.169132
RT Journal T1 <Title>Characterisation, simulation and test beam data analysis of stitched passive CMOS strip sensors</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.nima.2024.169132&Exemplar=1&LAN=DE A1 Zatocilova, Iveta A1 Arling, Jan-Hendrik A1 Baselga, Marta A1 Davis, Naomi A1 Diehl, Leena A1 Dingfelder, Jochen A1 Gregor, Ingrid-Maria A1 Hauser, Marc A1 Hemperek, Tomasz A1 Hügging, Fabian A1 Jakobs, Karl A1 Karagounis, Michael A1 Koppenhöfer, Roland A1 Kröninger, Kevin A1 Lex, Fabian A1 Parzefall, Ulrich A1 Rodriguez, Arturo A1 Sari, Birkan A1 Sorgenfrei, Niels A1 Spannagel, Simon A1 Sperlich, Dennis A1 Wang, Tianyang A1 Weingarten, Jens PB Elsevier BV YR 2024 SN 0168-9002 JF Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment VO 1061 SP 169132 LK http://dx.doi.org/https://doi.org/10.1016/j.nima.2024.169132 DO https://doi.org/10.1016/j.nima.2024.169132 SF ELIB - SuUB Bremen
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