I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

Sputter depth profiling of InN layers:

Kosiba, R ; Ecke, G ; Cimalla, V...
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms.  215 (2004)  3-4 - p. 486-494 , 2004
Link: https://doi.org/10.1016/j.nimb.2003.08.039