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1 Ergebnisse
1
In situ combined synchrotron X-ray diffraction and wafer cu..:
Fouet, J.
;
Richard, M.-I.
;
Mocuta, C.
..
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 284 (2012) - p. 74-77 , 2012
Link:
https://doi.org/10.1016/j.nimb.2011.07.019
RT Journal T1
In situ combined synchrotron X-ray diffraction and wafer curvature measurements during formation of thin palladium silicide film on Si(001) and Si (111)
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.nimb.2011.07.019&Exemplar=1&LAN=DE A1 Fouet, J. A1 Richard, M.-I. A1 Mocuta, C. A1 Guichet, C. A1 Thomas, O. PB Elsevier BV YR 2012 SN 0168-583X JF Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms VO 284 SP 74 OP 77 LK http://dx.doi.org/https://doi.org/10.1016/j.nimb.2011.07.019 DO https://doi.org/10.1016/j.nimb.2011.07.019 SF ELIB - SuUB Bremen
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