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Exploring cryogenic focused ion beam milling as a Group III..:
Dolph, Melissa Commisso
;
Santeufemio, Christopher
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 328 (2014) - p. 33-41 , 2014
Link:
https://doi.org/10.1016/j.nimb.2014.02.126
RT Journal T1
Exploring cryogenic focused ion beam milling as a Group III–V device fabrication tool
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.nimb.2014.02.126&Exemplar=1&LAN=DE A1 Dolph, Melissa Commisso A1 Santeufemio, Christopher PB Elsevier BV YR 2014 SN 0168-583X JF Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms VO 328 SP 33 OP 41 LK http://dx.doi.org/https://doi.org/10.1016/j.nimb.2014.02.126 DO https://doi.org/10.1016/j.nimb.2014.02.126 SF ELIB - SuUB Bremen
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