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Low energy proton induced single event upset in 65 nm DDR a..:

Ye, B. ; Liu, J. ; Wang, T.S....
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms.  406 (2017)  - p. 443-448 , 2017
Link: https://doi.org/10.1016/j.nimb.2017.03.162