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Depth profiling of interfacial fluctuation with nanometer o..:

Hoshino, Y. ; Toyohara, T. ; Takada, S...
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms.  450 (2019)  - p. 118-121 , 2019
Link: https://doi.org/10.1016/j.nimb.2018.02.029