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Changes in composite nc-Si-SiO2 thin films caused by 20 MeV..:
Nesheva, Diana
;
Petrik, Peter
;
Hristova-Vasileva, Temenuga
...
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 458 (2019) - p. 159-163 , 2019
Link:
https://doi.org/10.1016/j.nimb.2019.05.035
RT Journal T1
Changes in composite nc-Si-SiO2 thin films caused by 20 MeV electron irradiation
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.nimb.2019.05.035&Exemplar=1&LAN=DE A1 Nesheva, Diana A1 Petrik, Peter A1 Hristova-Vasileva, Temenuga A1 Fogarassy, Zsolt A1 Kalas, Benjamin A1 Šćepanović, Maja A1 Kaschieva, Sonia A1 Dmitriev, Sergei N. A1 Antonova, Krassimira PB Elsevier BV YR 2019 SN 0168-583X JF Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms VO 458 SP 159 OP 163 LK http://dx.doi.org/https://doi.org/10.1016/j.nimb.2019.05.035 DO https://doi.org/10.1016/j.nimb.2019.05.035 SF ELIB - SuUB Bremen
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