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Changes in composite nc-Si-SiO2 thin films caused by 20 MeV..:

Nesheva, Diana ; Petrik, Peter ; Hristova-Vasileva, Temenuga...
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms.  458 (2019)  - p. 159-163 , 2019
Link: https://doi.org/10.1016/j.nimb.2019.05.035