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Disorder induced in GaN thin films by 200 MeV silver ions:
Singh, Kamal
;
Gupta, Komal
;
Batra, Yogita
...
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 551 (2024) - p. 165346 , 2024
Link:
https://doi.org/10.1016/j.nimb.2024.165346
RT Journal T1 <Title>Disorder induced in GaN thin films by 200 MeV silver ions</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.nimb.2024.165346&Exemplar=1&LAN=DE A1 Singh, Kamal A1 Gupta, Komal A1 Batra, Yogita A1 Rathi, Vaishali A1 Kumar, Parmod A1 Kanjilal, D. A1 Kumar, Tanuj A1 Brajpuriya, Ranjeet K. A1 Kumar, Ashish PB Elsevier BV YR 2024 SN 0168-583X JF Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms VO 551 SP 165346 LK http://dx.doi.org/https://doi.org/10.1016/j.nimb.2024.165346 DO https://doi.org/10.1016/j.nimb.2024.165346 SF ELIB - SuUB Bremen
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