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1 Ergebnisse
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Ion-induced transformation of shallow defects into deep-lev..:
Singh, Kamal
;
Batra, Yogita
;
Rathi, Vaishali
...
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 552 (2024) - p. 165362 , 2024
Link:
https://doi.org/10.1016/j.nimb.2024.165362
RT Journal T1
Ion-induced transformation of shallow defects into deep-level defects in GaN epilayers
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.nimb.2024.165362&Exemplar=1&LAN=DE A1 Singh, Kamal A1 Batra, Yogita A1 Rathi, Vaishali A1 Kumar, Parmod A1 Kanjilal, D. A1 Kumar, Tanuj A1 Brajpuriya, Ranjeet K. A1 Kumar, Ashish PB Elsevier BV YR 2024 SN 0168-583X JF Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms VO 552 SP 165362 LK http://dx.doi.org/https://doi.org/10.1016/j.nimb.2024.165362 DO https://doi.org/10.1016/j.nimb.2024.165362 SF ELIB - SuUB Bremen
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