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1 Ergebnisse
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Mechanism of electrical performance degradation of 4H-SiC j..:
Li, Hao
;
Wang, Jingying
;
Song, Binghua
...
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 554 (2024) - p. 165452 , 2024
Link:
https://doi.org/10.1016/j.nimb.2024.165452
RT Journal T1 <Title>Mechanism of electrical performance degradation of 4H-SiC junction barrier Schottky diodes induced by neutron irradiation</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.nimb.2024.165452&Exemplar=1&LAN=DE A1 Li, Hao A1 Wang, Jingying A1 Song, Binghua A1 Li, Heyi A1 Geng, Long A1 Duan, Binghuang A1 Zhang, Shuo PB Elsevier BV YR 2024 SN 0168-583X JF Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms VO 554 SP 165452 LK http://dx.doi.org/https://doi.org/10.1016/j.nimb.2024.165452 DO https://doi.org/10.1016/j.nimb.2024.165452 SF ELIB - SuUB Bremen
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