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1 Ergebnisse
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Edge effect removal in Fourier ptychographic microscopy via..:
Pan, An
;
Wang, Aiye
;
Zheng, Junfu
...
Optics and Lasers in Engineering. 162 (2023) - p. 107408 , 2023
Link:
https://doi.org/10.1016/j.optlaseng.2022.107408
RT Journal T1
Edge effect removal in Fourier ptychographic microscopy via periodic plus smooth image decomposition
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.optlaseng.2022.107408&Exemplar=1&LAN=DE A1 Pan, An A1 Wang, Aiye A1 Zheng, Junfu A1 Gao, Yuting A1 Ma, Caiwen A1 Yao, Baoli PB Elsevier BV YR 2023 SN 0143-8166 JF Optics and Lasers in Engineering VO 162 SP 107408 LK http://dx.doi.org/https://doi.org/10.1016/j.optlaseng.2022.107408 DO https://doi.org/10.1016/j.optlaseng.2022.107408 SF ELIB - SuUB Bremen
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