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1 Ergebnisse
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Origins and characterization techniques of stress in SiC cr..:
Tian, Jiaqi
;
Xie, Xuejian
;
Zhao, Laibin
...
Progress in Crystal Growth and Characterization of Materials. 70 (2024) 1 - p. 100616 , 2024
Link:
https://doi.org/10.1016/j.pcrysgrow.2024.100616
RT Journal T1 <Title>Origins and characterization techniques of stress in SiC crystals: A review</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.pcrysgrow.2024.100616&Exemplar=1&LAN=DE A1 Tian, Jiaqi A1 Xie, Xuejian A1 Zhao, Laibin A1 Wang, Xinglong A1 Chen, Xiufang A1 Yang, Xianglong A1 Peng, Yan A1 Li, Xiaomeng A1 Hu, Xiaobo A1 Xu, Xiangang PB Elsevier BV YR 2024 SN 0960-8974 JF Progress in Crystal Growth and Characterization of Materials VO 70 IS 1 SP 100616 LK http://dx.doi.org/https://doi.org/10.1016/j.pcrysgrow.2024.100616 DO https://doi.org/10.1016/j.pcrysgrow.2024.100616 SF ELIB - SuUB Bremen
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