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Reliability analysis of a CNT-TF-FinFET for hostile tempera..:
Srivastava, Praween Kumar
;
Kumar, Atul
;
Kumar, Ajay
e-Prime - Advances in Electrical Engineering, Electronics and Energy. 6 (2023) - p. 100374 , 2023
Link:
https://doi.org/10.1016/j.prime.2023.100374
RT Journal T1 <Title>Reliability analysis of a CNT-TF-FinFET for hostile temperature</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.prime.2023.100374&Exemplar=1&LAN=DE A1 Srivastava, Praween Kumar A1 Kumar, Atul A1 Kumar, Ajay PB Elsevier BV YR 2023 SN 2772-6711 JF e-Prime - Advances in Electrical Engineering, Electronics and Energy VO 6 SP 100374 LK http://dx.doi.org/https://doi.org/10.1016/j.prime.2023.100374 DO https://doi.org/10.1016/j.prime.2023.100374 SF ELIB - SuUB Bremen
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