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1 Ergebnisse
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Depth of layers in historical materials measurable by X-ray..:
Trojek, Tomáš
;
Musílek, Ladislav
;
Prokeš, Radek
Radiation Physics and Chemistry. 155 (2019) - p. 239-243 , 2019
Link:
https://doi.org/10.1016/j.radphyschem.2018.06.047
RT Journal T1
Depth of layers in historical materials measurable by X-ray fluorescence analysis
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.radphyschem.2018.06.047&Exemplar=1&LAN=DE A1 Trojek, Tomáš A1 Musílek, Ladislav A1 Prokeš, Radek PB Elsevier BV YR 2019 SN 0969-806X JF Radiation Physics and Chemistry VO 155 SP 239 OP 243 LK http://dx.doi.org/https://doi.org/10.1016/j.radphyschem.2018.06.047 DO https://doi.org/10.1016/j.radphyschem.2018.06.047 SF ELIB - SuUB Bremen
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