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1 Ergebnisse
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An unknown wafer surface defect detection approach based on..:
Zhao, Zeyun
;
Wang, Jia
;
Tao, Qian
..
Reliability Engineering & System Safety. 244 (2024) - p. 109966 , 2024
Link:
https://doi.org/10.1016/j.ress.2024.109966
RT Journal T1 <Title>An unknown wafer surface defect detection approach based on Incremental Learning for reliability analysis</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.ress.2024.109966&Exemplar=1&LAN=DE A1 Zhao, Zeyun A1 Wang, Jia A1 Tao, Qian A1 Li, Andong A1 Chen, Yiyang PB Elsevier BV YR 2024 SN 0951-8320 JF Reliability Engineering & System Safety VO 244 SP 109966 LK http://dx.doi.org/https://doi.org/10.1016/j.ress.2024.109966 DO https://doi.org/10.1016/j.ress.2024.109966 SF ELIB - SuUB Bremen
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