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1 Ergebnisse
1
Total reflection x-ray fluorescence as a sensitive analysis..:
Sekowski, M.
;
Steen, C.
;
Nutsch, A.
...
Spectrochimica Acta Part B: Atomic Spectroscopy. 63 (2008) 12 - p. 1382-1386 , 2008
Link:
https://doi.org/10.1016/j.sab.2008.10.003
RT Journal T1 <Title>Total reflection x-ray fluorescence as a sensitive analysis method for the investigation of sputtering processes</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.sab.2008.10.003&Exemplar=1&LAN=DE A1 Sekowski, M. A1 Steen, C. A1 Nutsch, A. A1 Birnbaum, E. A1 Burenkov, A. A1 Pichler, P. PB Elsevier BV YR 2008 SN 0584-8547 JF Spectrochimica Acta Part B: Atomic Spectroscopy VO 63 IS 12 SP 1382 OP 1386 LK http://dx.doi.org/https://doi.org/10.1016/j.sab.2008.10.003 DO https://doi.org/10.1016/j.sab.2008.10.003 SF ELIB - SuUB Bremen
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