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Depth profile analysis of 100 keV Ni ions in Si 〈100〉 subst..:
Alam, Md. Akhlak
;
Tiwari, M.K.
;
Devi, Devarani
...
Spectrochimica Acta Part B: Atomic Spectroscopy. 206 (2023) - p. 106707 , 2023
Link:
https://doi.org/10.1016/j.sab.2023.106707
RT Journal T1 <Title>Depth profile analysis of 100 keV Ni ions in Si 〈100〉 substrate</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.sab.2023.106707&Exemplar=1&LAN=DE A1 Alam, Md. Akhlak A1 Tiwari, M.K. A1 Devi, Devarani A1 Tripathi, Shilpa A1 Trivedi, Ayushi A1 Ojha, Sunil A1 Singh, Rashmi A1 Gupta, Mukul PB Elsevier BV YR 2023 SN 0584-8547 JF Spectrochimica Acta Part B: Atomic Spectroscopy VO 206 SP 106707 LK http://dx.doi.org/https://doi.org/10.1016/j.sab.2023.106707 DO https://doi.org/10.1016/j.sab.2023.106707 SF ELIB - SuUB Bremen
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