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1 Ergebnisse
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Evidence of abnormal hot carrier thermalization at van Hove..:
Shang, Nianze
;
Huang, Chen
;
Chen, Qing
...
Science Bulletin. 69 (2024) 16 - p. 2522-2528 , 2024
Link:
https://doi.org/10.1016/j.scib.2024.06.019
RT Journal T1
Evidence of abnormal hot carrier thermalization at van Hove singularity of twisted bilayer graphene
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.scib.2024.06.019&Exemplar=1&LAN=DE A1 Shang, Nianze A1 Huang, Chen A1 Chen, Qing A1 Liu, Chang A1 Yao, Guangjie A1 Sun, Zhipei A1 Meng, Sheng A1 Liu, Kaihui A1 Hong, Hao PB Elsevier BV YR 2024 SN 2095-9273 JF Science Bulletin VO 69 IS 16 SP 2522 OP 2528 LK http://dx.doi.org/https://doi.org/10.1016/j.scib.2024.06.019 DO https://doi.org/10.1016/j.scib.2024.06.019 SF ELIB - SuUB Bremen
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