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Coupling pulse eddy current sensor for deeper defects NDT:
Xie, Lian
;
Gao, Bin
;
Tian, G.Y.
...
Sensors and Actuators A: Physical. 293 (2019) - p. 189-199 , 2019
Link:
https://doi.org/10.1016/j.sna.2019.03.029
RT Journal T1 <Title>Coupling pulse eddy current sensor for deeper defects NDT</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.sna.2019.03.029&Exemplar=1&LAN=DE A1 Xie, Lian A1 Gao, Bin A1 Tian, G.Y. A1 Tan, Jidong A1 Feng, Bo A1 Yin, Ying PB Elsevier BV YR 2019 SN 0924-4247 JF Sensors and Actuators A: Physical VO 293 SP 189 OP 199 LK http://dx.doi.org/https://doi.org/10.1016/j.sna.2019.03.029 DO https://doi.org/10.1016/j.sna.2019.03.029 SF ELIB - SuUB Bremen
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