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1 Ergebnisse
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Minority carrier lifetime imaging of silicon wafers calibra..:
Giesecke, J.A.
;
Schubert, M.C.
;
Michl, B.
..
Solar Energy Materials and Solar Cells. 95 (2011) 3 - p. 1011-1018 , 2011
Link:
https://doi.org/10.1016/j.solmat.2010.12.016
RT Journal T1
Minority carrier lifetime imaging of silicon wafers calibrated by quasi-steady-state photoluminescence
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.solmat.2010.12.016&Exemplar=1&LAN=DE A1 Giesecke, J.A. A1 Schubert, M.C. A1 Michl, B. A1 Schindler, F. A1 Warta, W. PB Elsevier BV YR 2011 SN 0927-0248 JF Solar Energy Materials and Solar Cells VO 95 IS 3 SP 1011 OP 1018 LK http://dx.doi.org/https://doi.org/10.1016/j.solmat.2010.12.016 DO https://doi.org/10.1016/j.solmat.2010.12.016 SF ELIB - SuUB Bremen
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