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Minority carrier lifetime imaging of silicon wafers calibra..:

Giesecke, J.A. ; Schubert, M.C. ; Michl, B...
Solar Energy Materials and Solar Cells.  95 (2011)  3 - p. 1011-1018 , 2011
Link: https://doi.org/10.1016/j.solmat.2010.12.016