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Correlation between the open-circuit voltage and recombinat..:
Jeong, Myeong Sang
;
Min, Kwan Hong
;
Choi, Sungjin
...
Solar Energy Materials and Solar Cells. 210 (2020) - p. 110519 , 2020
Link:
https://doi.org/10.1016/j.solmat.2020.110519
RT Journal T1
Correlation between the open-circuit voltage and recombination loss at metal-silicon interfaces of crystalline silicon solar cells
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.solmat.2020.110519&Exemplar=1&LAN=DE A1 Jeong, Myeong Sang A1 Min, Kwan Hong A1 Choi, Sungjin A1 Kang, Min Gu A1 Jeong, Kyung Taek A1 Lee, Eun Tae A1 Kang, Yoonmook A1 Kim, Donghwan A1 Lee, Hae-Seok A1 Song, Hee-eun A1 Park, Sungeun PB Elsevier BV YR 2020 SN 0927-0248 JF Solar Energy Materials and Solar Cells VO 210 SP 110519 LK http://dx.doi.org/https://doi.org/10.1016/j.solmat.2020.110519 DO https://doi.org/10.1016/j.solmat.2020.110519 SF ELIB - SuUB Bremen
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