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1 Ergebnisse
1
Origin of the improved stability under negative gate-bias i..:
Huang, Chuan-Xin
;
Li, Jun
;
Fu, Yi-Zhou
...
Superlattices and Microstructures. 88 (2015) - p. 426-433 , 2015
Link:
https://doi.org/10.1016/j.spmi.2015.09.036
RT Journal T1
Origin of the improved stability under negative gate-bias illumination stress in various sputtering power fabricated ZnSnO TFTs
UL https://suche.suub.uni-bremen.de/peid=cr-10.1016_j.spmi.2015.09.036&Exemplar=1&LAN=DE A1 Huang, Chuan-Xin A1 Li, Jun A1 Fu, Yi-Zhou A1 Zhang, Jian-Hua A1 Jiang, Xue-Yin A1 Zhang, Zhi-Lin PB Elsevier BV YR 2015 SN 0749-6036 JF Superlattices and Microstructures VO 88 SP 426 OP 433 LK http://dx.doi.org/https://doi.org/10.1016/j.spmi.2015.09.036 DO https://doi.org/10.1016/j.spmi.2015.09.036 SF ELIB - SuUB Bremen
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